产品详情
  • 产品名称:Rigel 1550 THz光纤耦合光谱仪

  • 产品型号:G5539AB858435E
  • 产品厂商:导入的产品
  • 产品价格:0
  • 折扣价格:0
  • 产品文档:
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简单介绍:
Rigel 1550太赫兹光纤耦合光谱仪是一款革新的并且稳定的太赫兹时域光谱系统,内置1550nm 飞秒激光器,光纤激光束分配底盘具有快扫和慢扫模块,内置锁相和低噪声放大器,配有控制操作软件。系统中产生端产生平行的THz光束和探测头长久对准,客户利用此系统可方便的进行透射、反射和衰减全反射实验。
详情介绍:

Rigel 1550太赫兹光纤耦合光谱仪是一款革新的并且稳定的太赫兹时域光谱系统,内置1550nm 飞秒激光器,光纤激光束分配底盘具有快扫和慢扫模块,内置锁相和低噪声放大器,配有控制操作软件。系统中产生端产生平行的THz光束和探测头长久对准,客户利用此系统可方便的进行透射、反射和衰减全反射实验。

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产品特点:

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  • Modular, fast, reconfigurable, compact, andnportable.
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  • Fiber coupled and movable transmitter andnreceiver heads.
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  • High speed scans.
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  • Built-in data acquisition, data processing,nand data display software.
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  • Adjustable scan speed, scan range, andnaveraging time.
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  • Transmission, reflection, and attenuatedntotal reflection measurement modules.
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  • Turn-key and easy to operate.
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  • Nitrogen purge option.
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  • Intuitive user interface.
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  • Can be used for testing of solids, liquidsnand gases.
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  • Permanently aligned optics.
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  • Provides real-time measurement.
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  • Hidden objects/features imaging.
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  • Reconfigurable around sample.
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  • Inter-molecular spectral response.
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  • Amplitude & phase measurement.
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  • Compatible to automation lines.
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  • Time-of-Flight 3D imaging.
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  • Time-domain pulse measurement
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系统参数:

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Scanning Mode:

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Slow and Fast Scan

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Slow Scan Range:

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up to 1.3 ns

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Fast Scan Range:

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up to 65 ps

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Slow Scan Speed:

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10 mm/s to 0.5 mm/s

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Fast Scan Rate:

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up to 20 waveforms/s

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Terahertz Bandwidth:

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> 1 THz

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Spectrum Dynamic Range:

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> 55 dB slow scan; > 40 dB fastn scan

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Laser Wavelength:

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1559 nm

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Size (W x L x H):

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60 cm X 60 cm X 105 cm

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Weight:

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250 lbs

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主要应用:

The Rigel 1550 Terahertz spectrometer isnportable, modular, compact, fast and reconfigurable for analysis of solids,nliquids, powders and gases. With its revolutionary fiber coupled Terahertznsensor technology, the Rigel 1550 provides higher performance and flexibilitynthan the state of the art in Terahertz systems. Allowing better discrimination,nless complex signal analysis, and enabling application which cannot be robustlynachieved with previous spectrometry technology.

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nApplications include but are not limited to:

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  • Material characterization.
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  • Material sensing.
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  • Non-destructive test.
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  • Terahertz spectroscopy.
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  • Hidden object detection.
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  • Product inspection.
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  • Manufacturing quality control.
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  • Material identification, such as plastics,npulp, paper, gels, organic powders, adhesives ect...
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  • Thickness measurement and uniformitynanalysis.
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  • Coating and then film analysis.
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  • Additives analysis.
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  • Electronic chip fault analysis.
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